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HL-II Scanning Microscope |
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System Introduction |
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HL-II uses a digital control system through a computer to perform STM and AFM scanning. A unique insert with probes preloaded is used for STM and AFM modes. Other than a button to control auto approach, all other controls are done on the computer. At any time during the scan, adjustments can be made to improve imagery. Calibration related data can be saved with the image. When transferring the data over to post processing, calibration information is there for calculations. Calibration parameters can also be saved for further use. This machine has an easy to use interface and has stable performance. |
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Features |
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 STM (Scanning Tunneling Microscope) |
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2 AFM (Atomic Force Microscope) Tapping and Contact Mode |
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Automatic Approach and Retreat function to avoid damaging sample/tip |
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True 3D graphics processing |
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Depth and Width of Calibration Function |
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Automatic identification of the different scanners |
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WINDOWS 9X compatibility for SPM Controller and Post-Processing software |
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Technical Parameters |
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| Resolution |
Horizontal: 0.1nm vertical: 0.01nm |
| Scan Range |
3µm X 3 µm, 20µm X 20µm |
| Scan Frequency |
1Hz —100Hz |
| Scan Rotation |
0 — 360° |
| D/A Precision |
16bit |
| A/D Precision |
16bit,16-channel |
| Bias Voltage |
0 —10V |
| Tunneling Current Preference |
0.1nA —10nA |
| Image Resolution |
512X512 |
| Color Quality |
256 |
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